Wisconsin Kart Eşleme Testi ve Olay-İlişkili Beyin Potansiyelleri Arasındaki İlişkiler

Mevcut çalışmanın iki amacı vardır. İlk amaç, Wisconsin Kart Eşleme Testi (WKET) sırasında elde edilen yanlış ve doğru tepkilerin beynin olay-ilişkili potansiyelleri (OİP) üzerinde nasıl bir etki yarattığını incelemektir. Çalışmanın ikinci amacı ise WKET ve OİPler arasındaki ilişkileri açıklamaya yönelik öne sürülen hata negativitesi ve hata positivitesi modellerini test etmek ve bu modellerin geçerlikleri konusundaki açıklamalara katkı sağlamaktır. Çalışmada 19-24 yaş aralığında toplam 30 gönüllü katılımcı yer almıştır. Çalışmada WKETin bilgisayar formu kullanılmıştır. Uyarıcıların sunumu, OİPlerin kayıt ve analizinde NeuroScan 4.2 sistemi kullanılmıştır. Belirlenen N1, N2, P2 ve P3 zirvelerinin genlik ve latans değerleri üç elektrot alanı (Fz, Cz ve Pz) için doğru ve yanlış tepkiler altında ayrı ayrı incelenmiştir. Davranışsal bulgular yanlış tepkiler için harcanan sürenin doğru tepkilere göre daha uzun; yanlış tepki sayısının doğru tepki sayısına göre daha az olduğunu göstermiştir. Varyans analizi sonuçları tepki türünün N2 zirvesinin latans ve genliği ile N1 zirvesinin genliği üzerinde; elektrot lokastonu temel etkisinin, N1, N2 zirvelerinin genlik ve latans; P2 zirvesinin genlik, P3 zirvesinin ise latans değerleri üzerindeki etkileri anlamlı bulunmuştur. Ayrıca, tepki türü ve elektrot lokasyonu ortak etkisinin N1, N2, ve P2 zirvelerinin genlik ve latansı ile P3 zirvesinin latasyon değerleri üzerinde anlamlı etki yarattığı görülmüştür. Sonuç olarak, WKET performansı sırasında yanlış ve doğru tepkilerin N2-P3 kompleks dalga formunu ortaya çıkardığı görülmüştür. Sonuçlar erken zirvelerin doğru ya da yanlış tepkilerin kendisiyle, buna karşın geç zirvelerin ise bu tepkilerin değerlendirilmesi süreciyle ilişkili olduğuna işaret etmiştir.

Relationships between Wisconsin Card Sorting Test and Event-Related Brain Potentials

There are two aims of the present study. The first aim is to investigate the effect of correct and incorrect responses that are obtained under Wisconsin Card Sorting Test (WCST) on event-related brain potentials (ERPs). The second aim is to test error negativity and error positivity models which developed to explore relationships between WCST and ERPs. The sample consisted of 30 university students (21 female, 9 male) aged 19-24 years. Computerized version of WCST was used. Stimulus presentation, recording, storage, and analysis were carried out using a 32 channel EEG/EP NeuroScan system. Amplitude and latency values for N1, N2, P2 and P3, peaks were investigated under three electrode locations (Fz, Cz, and Pz) and under correct and incorrect responses, separately. Behavioral results showed that duration for incorrect responses were higher than correct responses, on the other hand amount of correct responses were higher than incorrect responses. These results indicated that computerized version of the WCST has acceptable psychometric properties. Variance analyses for repeated measure design showed that response type main effect was significant on N2 latency, N1 and N2 amplitude. Electrode location main effect was significant on latency and amplitude of N1, N2; amplitude of P2 and latency of P3. In addition the interaction effect was significant on latency and amplitude of N1, N2, and P2, and also P3 latency. Results exposed correct and incorrect responses which were obtained under WCST leads N2-P3 peaks form. It was concluded that early ERP components might be related to response, on the other hand late ERP components might be related to response evaluation process.

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