Sb2S3 İnce Filmlerinin Yapısal ve Optik Özellikleri
Bu çalışmaya konu olan antimon sülfür ince filmler ultrasonik sprey piroliz tekniği kullanılarakhazırlanmıştır. Farklı alttaş sıcaklığına bağlı olarak hazırlanan antimon sülfür ince filmlerin optik veyapısal özellikleri sırasıyla UV-vis spektrofotometri ve XRD analizi kullanılarak incelenmiştir. Bu şekildealttaş sıcaklığını değiştirerek optik ve yapısal özelikleri kontrol etmek mümkün olmuştur. Filmlerin optiközellikleri, UV-vis spektrometresi kullanılarak enerji bant aralığı ölçümleri ile analiz edildi. 275, 300 ve325 °C’ de yapılan ve tavlanmamış filmler için enerji bant değerleri sırasıyla 2.36, 2.47 ve 1.84 eV olarakbulunurken, 500 °C’de sülfür ortamında tavlanan filmler için enerji bant değerleri sırasıyla 1.73, 1.76 ve1.77eV olarak bulundu. Bütün yönelimler için mikro yapı (e), düzlemler arası mesafe (d), kristalbüyüklüğü (D) ve dislokasyon yoğunluk (δ) XRD analizi kullanılarak belirlendi.
The Structural and Optical Properties of Sb2S3 Thin Films
The Antimony thiorea thin films which are the subject of this study were prepared by ultrasonic spray pyrolysis technique. The Antimony thiorea thin films were investigated depending on the substrate temperature. The optical and structural characteristics of these films were determined using UV–vis spectrophotometry and XRD analysis, respectively. By changing the substrate temperature, it was possible to control the optical and structural characteristic of the films. The optical properties films were analysed by energy band gap measurements using UV–vis spectrophotometry. While the band gaps of as grown films found to be 2.36, 2.47 ve 1.84eV, the band gaps of the films at annealing 500°C found to be 1.73, 1.76 ve 1.77eV. XRD analysis was used to determine the microstrain (e), lattice spacing phase (d), crystallite size (D) and dislocation density (δ) for all orientations.
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