Cu2FeSnS4 Kalkojenit Filmlerin Optik ve Morfolojik Özellikleri

P-tipi Cu2FeSnS4 (CFTS) ve Cu2ZnSnS4 (CZTS) kuaterner kalkojenit filmler, 30 ve 40 sccm kükürt akışıyla ilgili cam alt-tabakalar üzerinde döndürmeli kaplama yöntemiyle büyütülmüştür. Elde edilen numunelerin fiziksel özellikleri, X-ışını kırınımı (XRD) ölçüm sistemi, taramalı elektron mikroskobu (SEM), atomik kuvvet mikroskobu (AFM) ve ultraviyole görünür (Uv-vis) spektrofotometre ölçüm sistemi ile araştırılarak ince filmlerin biriktirme parametrelerinin etkisi incelenmiştir. Numunelerin kristal boyutu, dislokasyon yoğunluğu ve gerinim değeri gibi kristal parametreleri biriktirme parametrelerine bağlı olarak değişmektedir. XRD sonuçları, (112) pik yönelimi için yaklaşık 50 nm maksimum kristal boyutu ile kuaterner kalkojenit CFTS'nin kristal kalitesinde bir gelişmeyi gösterir. SEM görüntüleri hem XRD hem de AFM görüntüleri ile teyit edilen, kükürt akışındaki artışla parçacık boyutunun değiştiğini göstermektedir. Örneklerin absorpsiyon ve enerji bant aralığı değerinin kükürt akışının etkisini değiştirdiği ve 40 sccm için CZTS filmi, Uv-vis bölgesindeki tüm numunelerden daha güçlü absorpsiyon göstermiştir. Örneklerin bant aralığı değerleri, H2S gazında tavlanan CZTS (30 sccm), CZTS (40 sccm), CFTS (30 sccm) ve CFTS (40 sccm) filmler için sırasıyla 1.51,1.53,1.82 ve 1.91 eV olarak hesaplanmıştır.

Anahtar Kelimeler:

İnce film, Kristal boyut, Optik özellikler, Spin kaplama

Optical and Morphological Properties of Cu2FeSnS4 Chalcogenide Films

P-type Cu2FeSnS4 (CFTS) and Cu2ZnSnS4 (CZTS) quaternary chalcogenide films have been grown by the method of spin coating on glass substrates relate to 30 and 40 sccm sulfur flux. Physical properties of obtained samples were investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and ultraviolet visible spectroscopy (UV-Vis) to see the effect of deposition parameters on the thin film. The crystal parameters including crystal size, dislocation density and strain value of the samples were changed related to the deposition parameters. XRD results indicated an improvement of the crystalline quality of quaternary chalcogenide CFTS with a maximum crystal size of about 50 nm for (112) peak orientation. SEM images illustrated that the particle size was changed with an increase in the flux of sulfur, which was confirmed with both XRD and AFM images. It was seen that the absorption and energy band gap value of the samples changed the effect of sulfur flux and CZTS film for 40 sccm exhibited more strong absorption all samples in the UV-Vis region. The band gap values of the samples were calculated 1.51, 1.53, 1.82 and 1.91 eV for CZTS (30 sccm), CZTS (40 sccm), CFTS (30 sccm) and CFTS (40 sccm) films annealed H2S gas, respectively.

Keywords:

Crystal Size, Optical Properties, Spin coating, Thin Film,

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