Statistical approach for determining impulse breakdown voltage distribution under DC sweep voltage

This paper presents a comprehensive approach to the statistical characterization of impulse breakdown voltage under the effect of a DC sweep voltage. Several goodness-of-fit tests are applied to up-and-down test results obtained in the air-insulated rod-plane gap. Three distributions, normal, logistic, and Gumbel, are compared by means of the Kolmogorov--Smirnov goodness-of-fit test, and logistic distribution is also compared to 3-parameter Weibull distributions using the likelihood ratio test. Logistic distribution is found to be a possible alternative to normal and 3-parameter Weibull distributions.

Statistical approach for determining impulse breakdown voltage distribution under DC sweep voltage

This paper presents a comprehensive approach to the statistical characterization of impulse breakdown voltage under the effect of a DC sweep voltage. Several goodness-of-fit tests are applied to up-and-down test results obtained in the air-insulated rod-plane gap. Three distributions, normal, logistic, and Gumbel, are compared by means of the Kolmogorov--Smirnov goodness-of-fit test, and logistic distribution is also compared to 3-parameter Weibull distributions using the likelihood ratio test. Logistic distribution is found to be a possible alternative to normal and 3-parameter Weibull distributions.

___

  • W.J. Dixon, A.M. Mood, “A method for obtaining and analyzing sensitivity data”, Journal of American Statistical Association, Vol. 43, pp. 109–126, 1948.
  • IEC Publication 60-1, High-Voltage Test Techniques, Part 1: General Definitions and Test Requirements, International Electrotechnical Commission, International Standard, 1989.
  • IEEE Std 4-1995, IEEE Standard Techniques for High-Voltage Testing, The Institute of Electrical and Electronics Engineers, 1995.
  • I.C. Somerville, D.J. Tedford, “The spatial and temporal variation of ion densities in non-uniform-field gaps subjected to steady state or transient voltages”, Proceedings of the 3rd International Symposium on High Voltage Engineering, Vol. 2, pp. 53.02, 1979.
  • I.C. Somerville, D.J. Tedford, “Time-lags to breakdown: the detachment of atmospheric negative ions”, 5th International Conference on Gas Discharges, pp. 250–253, 1978.
  • H. Hirose, “More accurate breakdown voltage estimation for the new step-up test method in the Gumbel distribution model”, European Journal of Operational Research, Vol. 177, pp. 406–419, 2007. Y. Zhang, Z. Liu, Y. Geng, L. Yang, J. Wang, “Lightning impulse voltage breakdown characteristics of vacuum interrupters with contact gaps 10 to 50 mm”, IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 18, pp. 2123–2130, 2011.
  • C. Korasli, “Statistical inference for breakdown voltage in SF 6 GIS from first breakdown data”, IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 5, pp. 596–602, 1998.
  • F. Yildirim, C. Korasli, “Statistical approach for determining breakdown voltage of gas-insulated cables”, IEEE Transactions on Electrical Insulation, Vol. 27, pp. 1186–1192, 1992.
  • J.M. Meek, J.D. Craggs, Electrical Breakdown of Gases, New York, Wiley, 1978. S. Vibholm, P. Thyregod, “A study of the up-and-down method for non-normal distribution functions”, IEEE Transactions on Electrical Insulation, Vol. 23, pp. 357–364, 1988.
  • J.P. Marques de S´ a, Applied Statistics using SPSS, Statistica, MATLAB and R, 2nd ed., Berlin Heidelberg, SpringerVerlag, 2007.
  • A.M. Abouammoh, A.M. Alshingiti, “Reliability estimation of generalized inverted exponential distribution”, Journal of Statistical Computation and Simulation, Vol. 79, pp. 1301–1315, 2009. R.D. Gupta, D. Kundu, “Exponentiated exponential family: an alternative to gamma and Weibull distributions”, Biometrical Journal, Vol. 43, pp. 117–130, 2001.
  • W. Lu, D. Shi, “A new compounding life distribution: The Weibull–Poisson distribution”, Journal of Applied Statistics, Vol. 39, pp. 21–38, 2012.
  • S.C. Chapra, Numerical Methods for Engineers, 6th ed., McGraw-Hill, 2006.