Near Infrared Reflectance Spectroscopy and Multivariate Analyses for Fast and Non-Destructive Prediction of Corn Seed Germination

The application of near-infrared reflectance spectroscopy (NIRS) and multivariate analysis for determining the seed germination rate of corn genotypes was assessed. Seed samples about 90 gr belong to commercial and local corn varieties at various ages were scanned with FT-NIRS on the reflectance mode from 1000 to 2500 nm wavelength. Filter paper technique showed the seed germination rates varied between 18-100% depending on the genotypes after 7 days at ±25°C. Partial least squares regression (PLSR) was applied to the reference values corresponding to the spectra. The best statistical results obtained from the pre-treatment combinations of Smooth Savitzky-Golay 9 Points (sg9), MSC full and normalization to unit length (nle). The regression coefficient of calibration (R2C) and prediction (R2P) of the created NIRS calibration via chemometric software NIRCal are realized 0.97 and 0.98 respectively for the property of corn germination rate. The standard error of both calibration (SEC) and prediction (SEP) were almost overlapping (4.17%, 4.61% respectively). The prediction accuracy of the final NIRS model was quite reasonable with the acceptable root mean standard error of prediction (RMSEP) as 8.88%. According to the residual predictive deviation (RPD) index (4.18), the accuracy of the NIRS model regarded as in the best category. Therefore, the NIRS model developed here is sufficient to predict the corn seed germination rate very fast and non-destructively without using any regents.

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