Göreli Yüksek Sıcaklığın Kimyasal Biriktirme Yöntemi ile Üretilen Pbs İnce Filmleri Üzerindeki Etkileri
Kimyasal biriktirme yöntemi (KBY), ince film PbS'yi depolamak için kullanılmıştır. Deneylerde PbS, 55, 65, 75 ve 85 °C'lik dört farklı sıcaklıkta elde edilmiştir. Nispeten yüksek sıcaklığın etkileri detaylı olarak incelenmiştir. PbS filmlerin yapısal özellikleri X-ışını difraktometresi (XRD) kullanılarak araştırılmıştır. XRD'ye göre, sıcaklık arttığında, 75 °C'den yüksek depozisyon sıcaklığında tercihli yönelimin (111) düzlemden (002) düzleme kaydığı tespit edilmiştir. Ayrıca XRD sonuçlarından, kristalit büyüklükleri (cs), örgü sabitleri (a), ortalama gerilmeler (S), mikro gerilimler () ve dislokasyon yoğunlukları () elde edilmiştir. Üretilen PbS ince filmlerin yüzey özellikleri taramalı elektron mikroskobu (SEM) kullanılarak araştırılmıştır. SEM görüntülerinden, PbS filmler 55 °C'de elde edildiği zaman yüzeylerinde çatlak olduğu anlaşılmaktadır. Diğer yandan, 55 °C'den yüksek sıcaklıklarda üretilen PbS filmlerin 30000 büyütme oranındaki SEM görüntülerinde çatlak olmadığı görülmüştür.
Effects of Relatively High Temperature on Thin Films of PbS Fabricated by Chemical Bath Deposition Method
Chemical bath deposition (CBD) method was used to deposit thin filmsof PbS. In the experiments, PbS was obtained at four temperatures which are 55,65, 75 and 85 °C. The effects of relatively high temperature were investigated indetail. The structural properties of the PbS films were examined by using X-raydiffractometer (XRD). According to the XRD, it was found that when temperaturewas increased, the preferred orientation shifted from (111) plane to the (002)plane at a deposition temperature higher than 75 °C. Besides, crystallite sizes (cs),lattice constants (a), average stresses (S), micro strains () and dislocationdensities () were obtained from the XRD results. Surface properties of the PbSthin films were researched by using scanning electron microscope (SEM). It wasseen from the SEM images that there was crack on the surface of the films whenthe film was obtained at 55 °C. On the other hand, no cracks were observed in theSEM images of PbS films of 30000 magnifications produced at temperatures higherthan 55 °C.
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