İsmail ARSEL

On The Profile Of Frequency Dependent Series Resistance And Interface States In Al/TiO2/p-Si (MIS) Structures

On The Profile Of Frequency Dependent Series Resistance And Interface States In Al/TiO2/p-Si (MIS) Structures

Batman Üniversitesi Yaşam Bilimleri Dergisi

2012-Cilt: 2 - Sayı: 1

29-38

Sol-gel metodu, Al/TiO/p-Si (MIS) yapılar, Arayüzey durum yoğunluğu, Seri dirençler, Frekansa bağlılık

Sol-gel method, Al/TiO2/p-Si (MIS) structures, Interface state density, Series resistance, Frequency dependence

6018