PIXE, Particel Induced X-Ray Emission A Concise Review
PIXE-Particle Induced X-Ray Emission is a multielemental, sensitive and non-estructive method which has been in use in trace elemental analysis since 1970. This review aims to explain the main features of PIXE. References will be given at the end for those that seek more detailed knowledge on the principles and applications of this technique.
Anahtar Kelimeler:
particle induced X-ray emission, elemental analysis, trace element, ion induced X-ray.
PIXE, Particel Induced X-Ray Emission A Concise Review
PIXE-Particle Induced X-Ray Emission is a multielemental, sensitive and non-estructive method which has been in use in trace elemental analysis since 1970. This review aims to explain the main features of PIXE. References will be given at the end for those that seek more detailed knowledge on the principles and applications of this technique.
- ISSN: 1300-0527
- Yayın Aralığı: Yılda 6 Sayı
- Yayıncı: TÜBİTAK
Sayıdaki Diğer Makaleler
Electrochemical Polymerization and Analysis of Some Aniline Derivatives
Cu and Pb Adsorption on Some Bentonitic Clays
Oğuz İNEL, Fehmi ALBAYRAK, Ayşegül AŞKIN
Theoretical Studies on the Configurations of Benzhomobarrelene Derivatives
Metin BALCI, Rıza ABBASOĞLU, Abdullah MENZEK
Removal of Water-Soluble Cationic Dyes with TriSyl Silicas
Erdener KARADAĞ, Fatma AYDIN, Dursun SARAYDIN
The effect of lanthanum and barium additives on the thermal stabilization of $gamma-Al_2O_3$
A. İnci İŞLİ, Z. İlsen ÖNSAN, A. Erhan AKSOYLU
Indirect Complexometric Determination of Mercury Using Potassium Iodide as Selective Masking Agent
Gas Chromatography in the Low Concentration Determination of Nitrous Oxide and Volatile Anaesthetics