Fırat KAÇAR, Ayten KUNTMAN, Hakan KUNTMAN

Statistical Model of Hot-Carrier Degradation and Lifetime Prediction for P-MOS Transistors

Statistical Model of Hot-Carrier Degradation and Lifetime Prediction for P-MOS Transistors

Turkish Journal of Electrical Engineering and Computer Science

2006-Cilt: 14 - Sayı: 3

417-428

Hot-carrier, P-MOS transistor, lifetime prediction, statistical methods, MOS models

Hot-carrier, P-MOS transistor, lifetime prediction, statistical methods, MOS models

13046