Yüksek Roff/Ron Oranlı Memristörler İçin Bir Test Yöntemi

Yarı iletken elektronik elemanlar kullanımlarından önce test edilmelidirler. Memristörler varlığı 1971 yılında ortaya atılmış olan doğrusal olmayan elemanlardır ve bir memristif sistem 2008 yılında bulunmuştur. Memristörler son yıllarda önemli bir araştırma alanına dönüşmüştür. Ayrıca memristörlere ilave olarak memristif sistemler de memristör olarak adlandırılmaktadır. Literatürde memristörlere ait lineer iyon sürüklenme hızlı, doğrusal olmayan iyon sürüklenme hızlı ve eşik voltajlı olmak üzere çok sayıda model bulunmaktadır. Bir gün memristörler ticari olarak satıldığında devre tasarımcılarının bir memristör test yöntemine ihtiyaç olacaktır. Bu makalede öncelikle çeşitli memristör modelleri incelenmiş ve yüksek ROFF/RON oranına sahip memristörler için bir test yöntemi verilmiştir. Bu test sadece bir multimetre ya da ohmmetre kullanılarak yapılabilmekte ve ölçülen memristörün sağlam ya da bozuk olduğunu göstermektedir.

Anahtar Kelimeler:

Memristör, Eleman test, İnce filmler.

A Simple Test for Non-ideal Memristors

Semiconductor components must be tested before their usage. The test for a diode is well-known. Memristor is a nonlinear circuit element, whose existence has been predicted in 1971 and a memristive system behaving as memristor has been found in 2008. It is actually a nonlinear resistor with charge-dependency. In recent years, memristor has become an important research area. In addition to ideal memristors, memristive systems are nowadays also called memristors. However, memristor is not entirely known as a circuit element and there is still research undergoing to model it. Memristor has different models used in literature, such as linear dopant drift models, nonlinear dopant drift models, and threshold-based models. If memristor would become commercially available and start being commonly used in circuits, it will also need testing methods to be used by circuit designers. In this paper, by reviewing some of the memristor models given in literature, a simple test is suggested to be applied for individual memristors.

Keywords:

Memristor, Component test, Thin films,

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