Yasin ÖZCELEP, Ayten KUNTMAN, Hulusi Hakan KUNTMAN

97118

On the degradation of OTA-C--based CMOS low-power filter circuits for biomedical instrumentation

In this work, we propose a degraded transistor-based circuit degradation simulation method to investigate the degradation effect in complementary metal-oxide semiconductor (CMOS) biomedical devices. The method is demonstrated on an operational transconductance amplifier and capacitor (OTA-C)-based CMOS filter structure. First, we simulate the degradation of the symmetrical CMOS OTA by determining the degraded transistors in the structure. The simulation results are compared with the experimental results of our previous study. First- and second-order low-pass filter degradations are also simulated to demonstrate the accuracy of the proposed method. Finally, the degradation in the electroencephalogram band-pass filter and its effect on the diagnosis is discussed.

Anahtar Kelimeler:

Low-power biomedical circuits, CMOS OTA, reliability, degradation simulation

On the degradation of OTA-C--based CMOS low-power filter circuits for biomedical instrumentation

In this work, we propose a degraded transistor-based circuit degradation simulation method to investigate the degradation effect in complementary metal-oxide semiconductor (CMOS) biomedical devices. The method is demonstrated on an operational transconductance amplifier and capacitor (OTA-C)-based CMOS filter structure. First, we simulate the degradation of the symmetrical CMOS OTA by determining the degraded transistors in the structure. The simulation results are compared with the experimental results of our previous study. First- and second-order low-pass filter degradations are also simulated to demonstrate the accuracy of the proposed method. Finally, the degradation in the electroencephalogram band-pass filter and its effect on the diagnosis is discussed.

Keywords:

Low-power biomedical circuits, CMOS OTA, reliability, degradation simulation,

Turkish Journal of Electrical Engineering and Computer Science-Cover

ISSN: 1300-0632
Yayın Aralığı: Yılda 6 Sayı
Yayıncı: TÜBİTAK

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