Electron Spectroscopy for Material Characterization
Basic principles of the two electron spectroscopic techniques, the x-ray photoelectron spectroscopy, XPS, and the Auger electron spectroscopy, AES, are given. Their utilization in material characterization are introduced through examples with application of these techniques to various surface related problems.
Anahtar Kelimeler:
Turk. J. Chem., 22, (1998), 309-320. Full text: pdf Other articles published in the same issue: Turk. J. Chem., vol.22, iss.4.
Electron Spectroscopy for Material Characterization
Basic principles of the two electron spectroscopic techniques, the x-ray photoelectron spectroscopy, XPS, and the Auger electron spectroscopy, AES, are given. Their utilization in material characterization are introduced through examples with application of these techniques to various surface related problems.
Keywords:
Turk. J. Chem., 22, (1998), 309-320. Full text: pdf Other articles published in the same issue: Turk. J. Chem., vol.22, iss.4.,
- ISSN: 1300-0527
- Yayın Aralığı: Yılda 6 Sayı
- Yayıncı: TÜBİTAK
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Electron Spectroscopy for Material Characterization
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