Aerosol-assisted chemical vapor deposition of copper sulfide nanostructured thin film from newly synthesized single-source precursor
The copper(II) complex of N-[ethyl(butyl)carbamothioyl]- 3,5-dinitrobenzamide (1) has been synthesized and characterized by elemental analysis, IR spectroscopy, and atmospheric pressure chemical ionization-mass spectrometry. Thermogravimetric analysis shows that complex 2 decomposes in 2 steps to form copper sulfide. The complex was used as a single-source precursor for the deposition of copper sulfide thin film by aerosol-assisted chemical vapor deposition at 350 °C. The powder X-ray diffraction pattern of thin film of the complex showed the deposition of monoclinic roxbyite Cu7S4 and orthorhombic anilite Cu7S4 phases at 350 °C with spherical crystallites. The degree of film surface roughness was determined by atomic force microscopy. The scanning electron microscopy and energy dispersive X-ray analysis results showed the uniform distribution of copper sulfide in the film, which makes it a useful semiconducting material on a structured surface.
Aerosol-assisted chemical vapor deposition of copper sulfide nanostructured thin film from newly synthesized single-source precursor
The copper(II) complex of N-[ethyl(butyl)carbamothioyl]- 3,5-dinitrobenzamide (1) has been synthesized and characterized by elemental analysis, IR spectroscopy, and atmospheric pressure chemical ionization-mass spectrometry. Thermogravimetric analysis shows that complex 2 decomposes in 2 steps to form copper sulfide. The complex was used as a single-source precursor for the deposition of copper sulfide thin film by aerosol-assisted chemical vapor deposition at 350 °C. The powder X-ray diffraction pattern of thin film of the complex showed the deposition of monoclinic roxbyite Cu7S4 and orthorhombic anilite Cu7S4 phases at 350 °C with spherical crystallites. The degree of film surface roughness was determined by atomic force microscopy. The scanning electron microscopy and energy dispersive X-ray analysis results showed the uniform distribution of copper sulfide in the film, which makes it a useful semiconducting material on a structured surface.
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- Monajjemi, M.; Baei, M. T.; Mollaamin, F. Russian J. Inorg. Chem 2008, 53, 1430–1437.
- Monajjemi, M.; Mahdavian, L.; Mollaamin, F.; Khaleghian, M. Russian J. Inorg. Chem 2009, 54, 1465–1473. Zare, K.; Daroule, M.; Mollaamin, F.; Monajjemi, M. Int. J. Phys. Sci 2011, 6, 2536–2540.
- Sun, Y. G.; Xia, Y. N. Science 2002, 298, 2176–2179.
- Lee, H.; Yoon, S. W.; Kim, E. J.; Park, J. Nano Lett. 2007, 7, 778–7784.
- Wu, Y.; Wadia, C.; Ma, W.; Sadtler, B.; Alivisatos, A. P. Nano Lett. 2008, 8, 2551–2555.
- Wadia, C.; Alivisatos, A. P.; Kammen, D. M. Environ. Sci. Technol. 2009, 43, 2072–2077.
- Sakamoto, T.; Sunamura, H.; Kawaura, H. Appl. Phys. Lett. 2003, 82, 3032–3034.
- Chung, J. S.; Sohn, H. J. J. Power Sources 2002, 108, 226–231.
- Vaughan, D. J.; Craig, J. R. In Mineral Chemistry of Metal Sulfides; Harland, W. B.; Agrell, S. O.; Cook, A. H.; Hughes, N. F., Eds. Cambridge University Press: Cambridge, 1978, pp. 290–292.
- Fleet, M. E. Rev. Mineral. Geochem. 2006, 61, 365–420.
- Koch, D. F. A.; McIntyre, R. J. Electroanal. Chem. 1976, 71, 285–296.
- He, Y. B.; Polity, A.; Osterreicher, I.; Pfisterer, D.; Gregor, R.; Meyer, B. K.; Hardt, M. Phys. B 2001, 308–310, 1069–1073.
- Wang, S. Y.; Wang, W.; Lu, Z. H. Mater. Sci. Eng. B 2003, 103, 184–188.
- Sartale, S. D.; Lokhande, C. D. Mater. Chem. Phys. 2000, 65, 63–67.
- Hu, H.; Nair, P. K. Surf. Coat. Technol. 1996, 81, 183–189.
- Kemmler, K.; Lazell, M.; O’Brien, P.; Otway, D. J.; Park, J. H.; Walsh, J. R. J. Mater. Sci.: Mater. Electron. 2002, 13, 531–535.
- Moloto, M. J.; Revaprasadu, N.; O’Brien, P.; Malik, M. A. J. Mater. Sci. Mater. Electron. 2004, 15, 313–316. Arslan, H.; Fl¨ orke, U.; Kulcu, N.; Emen, M. F. J. Coord. Chem. 2006, 59, 223–228.
- Binzet, G.; Arslan, H.; Fl¨ orke, U.; Kulcu, N.; Duran, N. J. Coord. Chem. 2006, 59, 1395–1406.
- Bailey, R. A.; Peterson, T. R. Can. J. Chem. 1967, 45, 1135–1142.
- Perrin, D. D.; Armarego, W. L. F.; Perrin, D. R. Purification of Laboratory Chemicals, 3rd ed.; Pergamon Press: Oxford, 1988.
- Abdelhady, A. L.; Ramasamy, K.; Malik, M. A.; O’Brien, P.; Haigh, S. J.; Raftery, J. J. Mater. Chem. 2011, 21, 17888–17895.
- Saeed, S.; Rashid, N.; Jones, P. G.; Tahir, A. J. Heterocyclic. Chem. 2011, 48, 74–84.
- Saeed, S.; Rashid, N.; Jones, P. G.; Ali, M.; Hussain, R. Eur. J. Med. Chem. 2010, 45, 1323–1331.
- Saeed, S.; Rashid, N.; Jones, P. G.; Hussain, R.; Bhatti, M. H. Cent. Eur. J. Chem. 2010, 8, 550–558.
- Saeed, S.; Rashid, N.; Ali, M.; Hussain, R.; Jones, P. G. Eur. J. Chem. 2010, 1, 221–227.
- Saeed, S.; Wong, W. T. J. Heterocyclic. Chem. 2012, 49, 580–584.
- Saeed, S.; Rashid, N.; Bhatti, M. H.; Jones, P. G. Turk J. Chem. 2010, 34, 761–770.
- Ke, S. Y.; Xue, S. J. ARKIVOC 2006, x , 63–68.
- Wei, T. B.; Chen, J. C.; Wang, X. C. Synth. Commun. 1996, 26, 1147–1152.
- Fregona, D.; Giovagnini, L.; Ronconi, L.; Marzano, C.; Trevisan, A.; Sitran, S.; Biondi, B.; Bordin, F. J. Inorg. Biochem. 2003, 93, 181–189.
- El-Reash, G. M. A.; Taha, F. I.; Badr, G. Transition Met. Chem. 1990, 15, 116–119.
- Che, D. J.; Yao, X. L.; Li, G.; Li, Y. H. J. Chem. Soc., Dalton Trans. 1998, 1853–1856.
- Richter, R.; Beyer, L.; Kaiser, J. Z. Anorg. Allg. Chem. 1980, 461, 67–73.
- Beyer, L.; Hoyer, E.; Liebscher, J.; Hartmann, H. Z. Chem 1980, 21, 81–84.
- Irving, A.; Koch, K. R.; Matoetoe, M. Inorg. Chim. Acta 1993, 206, 193–198.
- Koch, K. R.; Sacht, C.; Bourne, S. Inorg. Chim. Acta 1995 232, 109–115.
- Mikami, M.; Nakagawa, I.; Shimanouch, T. Spectrochim. Acta 1967, 23A, 1037–1053.