Badar-ud-din AHMED, Wang YOUREN, Najam-ud-din AHMED

Application of asymmetrical periodic signals as test vectors for analog fault detection: a novel perspective of classical concepts

Application of asymmetrical periodic signals as test vectors for analog fault detection: a novel perspective of classical concepts

Turkish Journal of Electrical Engineering and Computer Science

2012-Cilt: 20 - Sayı: 4

523-536

Analog fault detection, analog test vector generation, asymmetrical periodic signals

Analog fault detection, analog test vector generation, asymmetrical periodic signals

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