Gülçin ERSÖZ DEMİR, İbrahim YÜCEDAĞ

Investigation of the Frequency and Voltage Dependent Dielectric Properties of Au/n-SiC Metal Semiconductor (MS) and Au/Al2O3/n-SiC Metal-Insulator-Semiconductor (MIS) Structures

Investigation of the Frequency and Voltage Dependent Dielectric Properties of Au/n-SiC Metal Semiconductor (MS) and Au/Al2O3/n-SiC Metal-Insulator-Semiconductor (MIS) Structures

Sakarya University Journal of Science

2020-Cilt: 24 Sayı: 5

1040-1052

Au/Al2O3/n-SiC (MIS) type structures, AC electrical conductivity, Dielectric Properties, Impedance measurements

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