CdO:Ag İnce Filmlerinin SILAR Tekniği İle Büyütülmesi ve Karakterizasyonu
Yapılan çalışmada gümüş (Ag) katkılı kadmiyum oksit (CdO) ince filmleri mikroskobik cam yüzey üzerine Ardışık İyonik Tabaka Adsorpsiyon ve Reaksiyonu (SILAR) yöntemi ile oda sıcaklığında büyütülmesi gerçekleştirilmiştir. Büyütülen numunelerin yapısal, optik ve morfolojik özellikleri incelenmiştir. Yapısal incelemede X-Işını Kırınımı (XRD) cihazı kullanılmış, XRD sonuçlarından numunelerin polikristal kübik yapıda olduğu ve ortalama kristal boyutunun Ag katkısı ile 22 nm’den ve 25 nm’ye arttığı görülmüştür. Soğurma ölçümleri, Ag katkı oranının artışı ile band aralığının 2.22 eV’den 2.67 eV’ye arttığını göstermiştir. Taramalı Elektron Mikroskopisi (SEM) görüntüleri Ag katkı oranı değişiminin yüzeyde değişime neden olduğunu ortaya koymuştur.
Growth And Characterization CdO:Ag Thin Films By SILAR Technique
In the study, Ag-doped CdO thin films were grown on the microscopic glass surface by SILAR method at room temperature. The structural, optical and morphological properties of the grown film were investigated. XRD device was used in the structural investigation, XRD results show that the samples have polycrystalline cubic structure and the average crystal sizes have been shown rising from 22 nm to 25 nm with Ag dopant. The absorbance measurements show that the band gap increase from 2.22 eV to 2.67 eV with the increasing Ag dopant ratio. SEM images show that the changing Ag dopant ratio causes the significant changing in the surface of samples.
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