SAF ZİRKONYUMUN MİKROARK OKSİDASYON YÖNTEMİYLE OKSİT ESASLI SERAMİK KAPLANMASI

Bu çalışmada, saf zirkonyumun yüzeyi mikroark oksidasyon yöntemi ile sabit elektriksel şartlarda ve aynıelektrolit kompozisyonunda 5, 15, 30, 45, 60, 90 ve 120 dakika süreyle kaplanmıştır. Zr üzerinde oluşturulankaplamanın faz kompozisyonu, mikroyapısı, yüzey morfolojisi ve mikrosertliği; X-ray kırınımı, taramalıelektron mikroskobu, profilometre ve mikrosertlik ölçümü ile karakterize edilmiştir. Kaplama tabakası gözenekliyapıda olup, önemli miktarda mikro çatlaklar içermektedir. Kaplamanın kristal yapıdaki monoklinik (m-ZrO2) vetetragonal (t-ZrO2) zirkonyum oksit fazlarından oluştuğu ve kaplama süresinin oluşan faz içeriğini etkilemediğitespit edilmiştir. Kaplama içerisinde zirkonyum ve oksijenin yanında silisyumun varlığı da tespit edilmiştir.Kaplama süresindeki artışla beraber kaplama kalınlığı doğrusal şekilde 5 μm’den 135 μm’ye yükselmiştir. Yüzeypürüzlülüğü kaplama süresi ile artarak, 0,5 μm’den 6,4 μm’ye yükselmiştir. Altlık malzeme zirkonyumun 200HV sertliğine karşılık, oksit kaplama tabakası sertliği yaklaşık 600 HV olarak ölçülmüştür ve mikrosertlikdeğerinde kaplama süresine bağlı sistematik bir değişim görülmemiştir.

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