Gülçin ERSÖZ DEMİR, İbrahim YÜCEDAĞ, Ercan ŞAHİN, Yakup BAKIŞ

Eş Zamanlı Veri Transferi ile Lcr-Metre ve Doğru Akım Kaynaklarının Senkron Çalıştırılması Sağlanarak Yarıiletken Cihazların Karakterizasyonunda Yeni Yöntem Geliştirilmesi

Organik elektronik alanında üretilen yarıiletken aygıtlar yüksek elektrik alanlar altında tetiklenmektedir ve bu tür aygıtların dielektrik analizini 100-200 V'luk gerilim altında yapan cihazlar piyasada bulunmamaktadır. Bu problemi çözebilmek için yüksek gerilim altında dielektrik analiz yapabilen niteliklere sahip bir ölçüm sistemi geliştirilmiştir. Bunun için geniş bir frekans aralığında birkaç voltluk AC uygulayarak dielektrik spektroskopi analizi yapan cihaza, harici bir DC gerilim kaynağı uygun bir şekilde bağlandı. Bu iki cihazın eşzamanlı çalışması gerekmektedir fakat bu işlemin bağımsız iki cihaz için manuel olarak yapılması oldukça zordur. Bu çalışmada, geliştirdiğimiz eş zamanlı veri transfer programı kullanılarak DC gerilim kaynağı (yarıiletken malzemeler veya aygıtların Akım-Gerilim (I-V) özelliklerinin belirlenmesinde kullanılan) ve LCR Metre cihazının (Kapasitans-Gerilim (C-V), Kapasitans-Frekans (C-f), Kondüktans-Gerilim (G-V) ve Kondüktans-frekans (G-f) özelliklerinin belirlenmesinde kullanılan) eş zamanlı haberleşebilmesi için program geliştirilmiştir. Eş zamanlı veri transfer program ile elde edilen tüm veriler program arayüzünde oluşturulan Excel dosyasına aktarılarak dielektrik spektroskopik özelliklerine ait bilgiler kayıt edilmektedir. Geliştirilen programın literatürde dielektrik özellikleri daha önceden belirlenmiş malzemeler üzerine yapılan ön çalışmalarda tutarlı ve hassas veriler elde edilebildiği ve yüksek bir performansla çalıştığı gözlenmiştir.

Anahtar Kelimeler:

Dielektrik Spektroskopisi, Eş Zamanlı Programlama, LCR Metre, DC gerilim kaynağı.

Developing A Novel Method for The Characterization of Semiconductor Devices by Provading Synchronous Operation of Lcr-Meters and Direct Current Sources by Using Real-Time Data Acquisition

Semiconductor devices produced in the field of organic electronics are triggered under high electric fields, and since such studies are new in the literature, devices that perform dielectric analysis under voltage of 100-200 V are not available in the market. In order to solve this problem, a measurement system with such characteristics was developed. For this purpose, an external DC voltage source was conveniently connected to the device that performs dielectric spectroscopy analysis by applying a few volts of AC over a wide frequency range. These two devices need to be perfectly synchronized, but it is very difficult to do this manually for two independent devices. In this study, a program that enables simultaneous communication between the DC voltage source (used in the determination of the Current-Voltage (I-V) properties of semiconductor materials and devices) and the LCR Meter device (used to determine the basic properties such as Capacitance-Voltage (C-V), Capacitance-Frequency (C-f), Conductance-Voltage (G-V), and Conductance-frequency (G-f)) was developed using real-time data acquisition program. All data obtained with the program can be transferred to the Excel file created in the program interface, and information on dielectric spectroscopic properties can be recorded. It was observed that the developed program was able to obtain consistent and sensitive data in preliminary studies on materials whose dielectric properties were previously determined in the literature, and that it worked with a high performance.

Keywords:

Dielectric Spectroscopy, Simultaneous Programming, LCR Meter, Source Meter.,

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