Omid GHAHGHAEİ, Saeed MALEKZADEH, Hamed NAEİMY

Design & modeling a novel Atomic Force Microscope (AFM) for detect roughness in turning machining

ISSN: 2587-2680
Yayın Aralığı: Yılda 4 Sayı
Başlangıç: 2002
Yayıncı: SİVAS CUMHURİYET ÜNİVERSİTESİ > FEN FAKÜLTESİ

Abstract. In this paper we design and modeling a novel AFM (Atomic Force Microscope) that use it in turning machining. We know that work piece roughness is very essential part in final product in every machining method specially in turning. In this case we want to know availability of using AFM in turning. So at first designed a kind of AFM with cantilever beam, piezoelectric and piezoresistance. After that we should modeling this design in our situation, for these we define some surface that may be happen in machining. So know modeled our design for sample surface. At the end of project a P control method has been used for controlling our processing.

Keywords:

Atomic Force Microscope, turning machining; roughness; AFM control; cantilever beam,

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