Omid GHAHGHAEİ, Saeed MALEKZADEH, Hamed NAEİMY

Design & modeling a novel Atomic Force Microscope (AFM) for detect roughness in turning machining

Cumhuriyet Science Journal

2015-Cilt: 36 - Sayı: 3

1-10

Atomic Force Microscope, turning machining; roughness; AFM control; cantilever beam

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