Püskürtme Yöntemi ile Farklı Taban Sıcaklıklarında Elde Edilen Cd0,22Zn0,78S Filmlerinin X-Işınları Çalışması

Cd0,22Zn0,78S filmleri farklı taban sıcaklıklarında püskürtme yöntemi ile elde edilmiştir. Bu çalışma, elde edilen filmlerin oda sıcaklığında alınan X-ışını kırınım desenlerini açıklamaktadır. Alınan bu desenler filmlerin hekzagonal Cd0,22Zn0,78S yapıda ve polikristal olduğunu göstermektedir. Film kalınlığı, yapılanma katsayısı, tanecik boyutu değerleri, örgü sabitleri ve d-değerlerinin bağıl % hatası hesaplanmıştır. Elde edilen filmlerin bu özelliklerine taban sıcaklığının etkisi araştırılmıştır.

Anahtar Kelimeler:

Kadmiyum çinko sülfür, Püskürtme yöntemi, X-ışınları kırınım desenleri, Yapılanma katsayısı, Tanecik boyutu

X-Ray Diffraction Studies of Cd0.22Zn0.78S Films Deposited by Spray Pyrolysis Method at Different Substrate Temperatures

Cd0.22Zn0.78S films have been deposited by the spray pyrolysis method at different substrate temperatures. This work describes the x-ray diffraction spectra of all the films at room temperature. These spectra of the films showed that they are hexagonal and formed as Cd0.22Zn0.78S polycrystalline structure. Film thickness, texture coefficient, grain size values, lattice constants, and d% error were calculated. Effects of substrate temperature on these properties of the deposited films have been systematically investigated.

Keywords:

Cadmium zinc sulfide, Spray pyrolysis method, X-ray diffraction spectra, Texture coefficient, Grain size,

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