Nanoyapılı CuO Filmlerin Fiziksel Performansının Surfaktan TX-100 Yoluyla Geliştirilmesi

Bu çalışmada TX-100 surfaktan içeren ve içermeyen CuO filmler sistematik bir yaklaşım gözeterek SILAR yöntemi yardımıyla elde edilmişlerdir. Elde edilen CuO filmlerinin morfolojik, yapısal ve optik özellikleri, TX-100 konsantrasyonuna bağlı olarak sırasıyla metal mikroskobu, taramalı elektron mikroskobu, X-ışını difraksiyon analizi ve ultraviyole-görünür spektrometresi ile incelendi. Metal ve taramalı elektron mikroskobu fotoğrafları, film yüzey morfolojisinin yüzey aktif madde TX-100 tarafından etkilendiğini ortaya koydu. X-ışını kırınım desenleri, tüm CuO filmlerinin (1 11) ve (111) düzlemlerin tercihli yönelimleriyle monoklinik kristal kafes yapısına sahip olduğunu doğruladı. Ultraviyole – görünür spektrum, filmlerin optik bant boşluğu ve geçirgenlik değerlerinin TX-100 içeriği ile değiştiğini gösterdi.

Enhancement Physical Performance of Nanostructured CuO Films via Surfactant TX-100

In this study, we informed a systematic approach to obtain CuO filmswith and without TX-100 surfactant by the SILAR procedure. Morphological,structural and optical features of the CuO films were researched by metallurgicalmicroscope, scanning electron microscopy, X-ray diffraction analysis andultraviolet–visible spectrophotometry respectively with respect to concentrationsof TX-100 agent. Metallurgical and scanning electron microscope photographsdisplayed that the morphology of the film surface was impressed by surfactant TX-100. X-ray diffraction patterns verified that all CuO films have monoclinic crystallattice structure with preferential orientations of (1 11) and (111) planes.Ultraviolet–visible spectra demonstrated that the optical bandgap andtransmittance values of the films were altered with TX-100 content.

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