M. CANKURTARAN, H. ÇELİK, E. TIRAŞ and A. BAYRAKLI

Well-width dependence of warm electron relaxation and interface roughness scattering in GaAs/Ga1-xAlxAs multiple quantum wells

Well-width dependence of warm electron relaxation and interface roughness scattering in GaAs/Ga1-xAlxAs multiple quantum wells

Turkish Journal of Physics

1999-Cilt: 23 - Sayı: 4

565-576

Turk. J. Phys., 23, (1999), 565-576. Full text: pdf Other articles published in the same issue: Turk. J. Phys., vol.23, iss.4.

Turk. J. Phys., 23, (1999), 565-576. Full text: pdf Other articles published in the same issue: Turk. J. Phys., vol.23, iss.4.

496