Jochan JOSEPH, Varghese MATHEW, Jacob MATHEW, K. E. ABRAHAM
37-47
Thin films, vapour deposition, x-ray diffraction, electrical properties, optical properties.
Thin films, vapour deposition, x-ray diffraction, electrical properties, optical properties.
Studies on Physical Properties and Carrier Conversion of SnO2:Nd Thin Films
Jochan JOSEPH, Varghese MATHEW, Jacob MATHEW, K. E. ABRAHAM
MEVLÜT KARABULUT, HÜSEYİN ERTAP, Hasan MAMMADOV, GÜVENTÜRK UĞURLU, Mustafa Kemal ÖZTÜRK
Influence of composition on the structure and optoelectronic properties of PbxIn25-xSe75 thin films
Hesham Azmi ELMELEEGI, Zeinab El Sayed EL MANDOUH, Ahmad Abdel MOEZ
Characterization of Spray Deposited Bismuth Oxide Thin Films from Non-Aqueous Medium
V.V. KILLEDAR, C.D. BHOSALE, C. D. LOKHANDE
Analysis of amplitude and slope diffraction coefficients
MEHMET BARIŞ TABAKCIOĞLU, AHMET CANSIZ