Bahar ASGARI,
Mahmoud TABANDEH,
Mahdi FAZELI,
Ramin RAJAEI
Single event multiple upset-tolerant SRAM cell designs for nano-scale CMOS technology
Single event multiple upset-tolerant SRAM cell designs for nano-scale CMOS technology
Turkish Journal of Electrical Engineering and Computer Sciences
2017-Cilt: 25 - Sayı: 2
1035-1047
46
48