Asim MANTARCI
Detailed Structural and Morphological Characterization of InGaN Thin Films Grown by RF Magnetron Sputtering with Various Substrate Temperature
Detailed Structural and Morphological Characterization of InGaN Thin Films Grown by RF Magnetron Sputtering with Various Substrate Temperature
Celal Bayar Üniversitesi Fen Bilimleri Dergisi
2019-Cilt: 15 - Sayı: 2
151-160
73
88