S. Pamir ALPAY, Alexander L. ROYTBURD

Thickness Dependence of c/a Polytwin Structures Observed in Epitaxial Oxide Ferroelectric Thin Films

Thickness Dependence of c/a Polytwin Structures Observed in Epitaxial Oxide Ferroelectric Thin Films

Turkish Journal of Physics

2000-Cilt: 24 - Sayı: 2

85-91

Turk. J. Phys., 24, (2000), 85-92. Full text: pdf Other articles published in the same issue: Turk. J. Phys., vol.24, iss.2.

Turk. J. Phys., 24, (2000), 85-92. Full text: pdf Other articles published in the same issue: Turk. J. Phys., vol.24, iss.2.

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