RAMIN RAJAEI, BAHAR ASGARI, MAHMOUD TABANDEH, MAHDI FAZELI

Single event multiple upset-tolerant SRAM cell designs for nano-scale CMOS technology

Turkish Journal of Electrical Engineering and Computer Science

2017-Cilt: 25 - Sayı: 2

1035-1047

Single event upset (SEU), single event multiple upset (SEMU), soft error, SRAM cell

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