Y. BOUREZIG,
B. BOUABDALLAH,
F. GAIFFOT
ANALYSIS OF THE RESISTIVITY IN POLYSILICON THIN FILM TRANSISTORS Study of film thickness effect
ANALYSIS OF THE RESISTIVITY IN POLYSILICON THIN FILM TRANSISTORS Study of film thickness effect
Electrica
2008-Cilt: 8 Sayı: 2
733-738
Thin–Film Transistor,
chemical vapour deposition,
electrostatic coupling,
modelling
366
400