Yasin ÖZCELEP,
Ayten KUNTMAN,
Hakan KUNTMAN
STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION
STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION
Electrica
2008-Cilt: 8 Sayı: 1
549-555
Symmetrical CMOS OTA,
Reliability Analysis,
Statistical Methods
401
435