Ahmet KAYMAZ

Negative Capacitance Phenomenon in GaAs-Based MIS Devices Under Ionizing Radiation

Negative Capacitance Phenomenon in GaAs-Based MIS Devices Under Ionizing Radiation

Balkan Journal of Electrical and Computer Engineering

2023-Cilt: 11 Sayı: 2

156-162

Abnormal/Anomalous peak, GaAs-based devices, Ionizing radiation, MOS devices, Negative capacitance.

20112