Muhammed Can ÖZDEMİR, Ömer SEVGİLİ, İkram ORAK, Abdülmecit TÜRÜT

Effect of measurement frequency on admittance characteristics in Al/p-Si structures with interfacial native oxide layer

Effect of measurement frequency on admittance characteristics in Al/p-Si structures with interfacial native oxide layer

International Journal of Chemistry and Technology

2019-Cilt: 3 - Sayı: 2

129-135

Metal-semiconductor contacts, MIS diodes, interface states, capacitance characteristics, conductance characteristics

6015